[1]刘敏安,向 华,徐丽宾,等.机车IGBT模块应用失效研究[J].机车电传动,2020,(01):13-17.[doi:10.13890/j.issn.1000-128x.2020.01.101]
 LIU Min,an,XIANG Hua,et al.Research of IGBT Module Application Failure for Locomotive[J].Electric Drive for Locomotives,2020,(01):13-17.[doi:10.13890/j.issn.1000-128x.2020.01.101]
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机车IGBT模块应用失效研究()
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机车电传动[ISSN:1000-128X/CN:43-1125/U]

卷:
期数:
2020年01期
页码:
13-17
栏目:
功率半导体技术
出版日期:
2020-01-10

文章信息/Info

Title:
Research of IGBT Module Application Failure for Locomotive
文章编号:
1000-128X(2020)01-0013-05
作者:
刘敏安向 华徐丽宾马 瑶
(株洲中车时代半导体股份有限公司,湖南 株洲 412001)
Author(s):
LIU Min an XIANG Hua XU Libin MA Yao
( Zhuzhou CRRC Times Semiconductor Co., Ltd., Zhuzhou, Hunan 412001, China )
关键词:
机车IGBT开关状态失效模式
Keywords:
locomotive IGBT switch state failure mode
分类号:
U264.3+7;TN325+.2
DOI:
10.13890/j.issn.1000-128x.2020.01.101
文献标志码:
A
摘要:
针对机车IGBT模块应用失效后发生炸损,造成失效原因很难查找的问题,分析IGBT模块在应用工况下的开关状态,得出5种失效模式类型。结合厂内和现场失效模式分布统计,对5种失效模式和早期失效以及应用过程中引起的失效进行原因分析,最后从应用和器件2个维度针对性提出设计改进意见。
Abstract:
Aiming at the problem of explosion damage of IGBT module used in locomotive after application failure, which makes it difficult to find the failure reason.The switch state of IGBT module under the application condition was analyzed, and five failure modes were put forward. Based on the statistical distribution of failure modes in the factory and in the field of application, the causes of five failure modes and early failures as well as the failures caused in the application process were analyzed. Finally, the design improvement suggestions were put forward from the application and device dimensions.

参考文献/References:

[1] 王兆安, 黄俊. 电力电子技术[M]. 4版. 北京: 机械工业出版社, 2001.

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[5] HAERTL A, SOELKNER G, PFIRSCH F, et al. Influence of dynamic switching on the robustness of power devices against cosmic radiation[C]//IEEE. 2012 24th International Symposium on Power Semiconductor Devices and ICs. Bruges: IEEE, 2012: 353-356. DOI: 10.1109/ISPSD.2012.6229094.
[6] 赵振波, RUSCHE Wilhelm, 马国伟. 大功率IGBT 5模块开关特性研究[J]. 大功率变流技术, 2017(2): 33-37.

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备注/Memo

备注/Memo:
作者简介:刘敏安(1983—),男,高级工程师,主要从事IGBT应用与测试研究。
更新日期/Last Update: 2020-01-10