[1]王彦刚,Chamund Dinesh,李世平,等.功率IGBT模块的寿命预测[J].机车电传动,2013,(02):13-17.[doi:10.13890/j.issn.1000-128x.2013.02.004]
 WANG Yan-gang,Chamund Dinesh,LI Shi-ping,et al.Lifetime Prediction of Power IGBT Module[J].Electric Drive for Locomotives,2013,(02):13-17.[doi:10.13890/j.issn.1000-128x.2013.02.004]
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功率IGBT模块的寿命预测()
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机车电传动[ISSN:1000-128X/CN:43-1125/U]

卷:
期数:
2013年02期
页码:
13-17
栏目:
技术专题
出版日期:
2013-03-10

文章信息/Info

Title:
Lifetime Prediction of Power IGBT Module
文章编号:
1000-128X(2013)02-0013-05
作者:
王彦刚Chamund Dinesh李世平Jones Steve窦泽春忻兰苑刘国友
株洲南车时代电气股份有限公司功率半导体研发中心
Author(s):
WANG Yan-gang Chamund Dinesh LI Shi-ping Jones Steve DOU Ze-chun XIN Lan-yuan LIU Guo-you
( Power Semiconductor R&D Center, Zhuzhou CSR Times Electric Co., Ltd., Lincoln, LN6 3LF, United Kingdom )
关键词:
IGBT 模块可靠性功率循环试验失效机制寿命预测
Keywords:
IGBT module reliability power cycling test failure mechanism lifetime prediction
分类号:
TN34
DOI:
10.13890/j.issn.1000-128x.2013.02.004
摘要:
介绍了功率循环试验数据的威布尔分析方法,分析了现有的典型模块寿命模型,论述了寿命预测的方法:将任务曲线转化成温度曲线,利用雨流计数法,根据线性疲劳损伤积累理论和寿命模型计算功率循环寿命。最后,预测了应用于HXD1C 电力机车的株洲南车时代电气股份有限公司3 300 V/1 200 A IGBT 模块的功率循环寿命。
Abstract:
The Weibull methodology for power cycling test data and some reported typical lifetime models were firstly discussed. Then, lifetime prediction procedures were presented including the conversion of mission profile to temperature profile, the temperature cycles counting by Rainflow algorithm, and lifetime calculating based on the fatigue linear accumulation damage theory and lifetime models. Lastly, as an example, power cycling lifetime of 3 300 V/1 200 A IGBT modules manufactured by Zhuzhou CSR Times Electric Co., Ltd., subjected to the application of HXD1C locomotive was predicted.

参考文献/References:

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备注/Memo

备注/Memo:
作者简介:王彦刚(1974-),男,博士,高级工程师,目前主要从事新型功率IGBT 模块的设计封装及可靠性分析等工作。
更新日期/Last Update: 2013-03-10